MicroVision Integrated Circuit (IC) Mark/Lead Inspector
MicroVision's MV996M+ IC Mark / Lead Inspector is charted to focus on the core functions by providing higher versatility and reliable inspection system for various applications in the semiconductor packaging field. MicroVision has adopted significant hardware advancement to improve the sensitivity and utility of the system, as well as offers considerable extent throughput.
Bringing forth a new inspection standard, this modular next-generation Inspector MV996M+, monitors a paradigm shift needed for tray-to-tray handling platform with better inspection accuracy. It is designed to match among themselves and correlate to the previous-generation MV996M system, providing exceeding capabilities with its technologies.
With the wealth of experience drawn from designing various high performance inspectors for the semiconductor industry, we have designed a high-performance integrated circuit (IC) inspector system for device measurements. It is completed with a portfolio of 2D and 3D inspection capabilities that is built on the overwhelming success of MV996M.MV996M+™ Brochure